Secondary ion intensity
Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions … See more In 1910 British physicist J. J. Thomson observed a release of positive ions and neutral atoms from a solid surface induced by ion bombardment. Improved vacuum pump technology in the 1940s enabled the first … See more Detection limits for most trace elements are between 10 and 10 atoms per cubic centimetre, depending on the type of instrumentation used, the primary ion beam used and the analytical area, and other factors. Samples as small as individual pollen … See more The COSIMA instrument onboard Rosetta was the first instrument to determine the composition of cometary dust in situ with secondary ion mass spectrometry during the spacecraft's 2014–2016 close approaches to comet SIMS is used for … See more A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, accelerating … See more In the field of surface analysis, it is usual to distinguish static SIMS and dynamic SIMS. Static SIMS is the process involved in surface atomic monolayer analysis, or surface molecular analysis, usually with a pulsed ion beam and a time of flight mass spectrometer, while … See more • NanoSIMS See more • Benninghoven, A., Rüdenauer, F. G., Werner, H. W., Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, Wiley, New York, 1987 (1227 pages), ISBN 0-471-51945-6 • Vickerman, J. C., Brown, A., Reed, … See more Web20 Feb 2024 · The intensities of all the autosearched secondary ion peaks at each pixel of each TOF-SIMS data were used for data fusion and multivariate analysis. TOF-SIMS data …
Secondary ion intensity
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Web24 Dec 2013 · The chemical composition of matrix can affect the secondary ion intensity of deuterium, because it affects secondary ion yield and sputtering (the so-called matrix effect). To obtain the same chemical composition for bcc and fcc Fe, the Fe–30 % Ni alloy was partially martensitic transformed by cooling at around −120 °C. Web20 Feb 2013 · Since the intensity of (DPPC + H) + changes with mixing time, the gas-phase protonation of DPPC (equation 1) does not appear to be a major reaction pathway in the secondary ion yield enhancements observed using IL matrices. Subsequent experiments employed mixing times between 60 and 300 s (1 and 5 min) to maximize the analyte …
WebHowever, under an optimized GCIB-O 2+ cosputter, the secondary ion intensity quickly reached a steady state and retained >95% intensity with respect to the pristine surface, … Web4 Jun 2024 · Secondary Ion Mass Spectrometry and Electron M icroscopy: Comparison of Intensity – Hue – Saturation and Laplacian Pyramid Method s for Image Fusion Anal. Chem. 89 10702 – 10
Web18 Nov 2024 · The hydrogen atom depth profile was determined by layer-by-layer analysis of the dependence of the secondary ion sputtering intensity on sputtering time, I(t). The etch rate was calculated by the formula S = Z/t, where S is the etch rate and Z is the depth of the crater (Z was measured by means of a Talysurf CCI-2000 optical profilometer). Web22 Sep 2024 · A secondary ion mass spectrometry (SIMS) protocol for ultra-high precision and accuracy Si isotope measurements of a 28 Si-enriched crystal (AVO28) was developed in this study using a reverse-geometry ion microprobe SHRIMP RG. An ≈8 nA primary beam intensity was used to sputter the 28 Si-enriched crystal.
Web1 Feb 2011 · Secondary ion mass spectrometry (SIMS) is a technique that has evolved to be one of the most powerful techniques for the analysis of organic samples.
WebTime of flight secondary ion mass spectrometry (ToF-SIMS) is a key surface analytical technique frequently employed for the analysis of polymeric and other materials [4][5][6][7] [8]. Recent ... full shade shrubs for shadeWeb27 Mar 2024 · Time-of-flight secondary ion mass spectrometry (ToF-SIMS) with Bi 32+ as the primary ion was used to examine surfaces sputtered at different fluences. The sputter … full shadow crossword clueWeb17 Mar 2024 · Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to … ginny e georgia 2 streaming ita gratisWeb8 Mar 2016 · However, under an optimized GCIB-O2+ cosputter, the secondary ion intensity quickly reached a steady state and retained >95% intensity with respect to the pristine surface, although the damage ... full shade tropical plantsWebSecondary ion mass spectrometry (SIMS) is a desorption mass spectrometry (MS) technique, and is widely used in industry and research. SIMS can be employed to obtain … full shade tall plantsWeb20 Sep 2024 · A method for rapid quantitative imaging of dopant distribution using secondary ion mass spectrometry (SIMS) is described. The method is based on SIMS … ginny e georgia assistir online gratisWebThe secondary ion measurement part consists of three components, an ion energy analyzer, mass analyzers, and detectors. The ion energy analyzer has electrostatic sector that … full shade trees